Toy Lid Durability Tester
Application
Toy Lid Durability Tester applies to test the durability of toys lid switch can be repeated.
The instrument with a rotating pendulum driven toys lid movements, simulated toy lid after a certain number of repeated opening and closing movements, the toy lid hinged part of the feature is intact.Toy Lid Durability Tester complies with ASTM F963 National Safety Technical Code for Toys Manufacturing
Technical parameters
Test times
0-999, 999 times can be set
Test precision
0-10 time/min
Display mode
Displayed by big digital liquid crystal screen
Control mode
Controlled by Micro-computer automatically
Action mode
Electromotion or Automatism
Test pieces
Stop automatically
Testing Standards
16 CFR 1500, ASTM F963 4.8, EN-71, ISO 8124
NOTE
1. Independent carton packaging
2. In stock
Please review video of the Toy Lid Durability Tester operation as below link:
https://www.youtube.com/edit?o=U&video_id=u9A9wAH5uJc
What is a lid test?
Light Induced Degradation (LID) testing ensures the efficiency of PV modules during their complete lifetime. Thus, estimating Light Induced Degradation (LID) is an important task for simulations of yield and cost effectiveness of PV systems.
What is LID effect?
The LID Effect
The first phenomenon, known in the industry for more than 20 years, is called Light Induced Degradation (LID) and is spotted from the first hours of exposure of the panels to sunlight, due to traces of oxygen present in the silicon wafer.